Vertically integrated modeling of light-induced defects: Process modeling, degradation kinetics and device impact

Author(s)
Laine, Hannu S.; Vahlman, Henri; Haarahiltunen, Antti; Jensen, Mallory Ann; Modanese, Chiara; ... Show more
Thumbnail
DownloadPublished version (696.2Kb)
Publisher Policy
Terms of use
Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
Metadata
Show full item record
Date issued
2018-03
URI
https://hdl.handle.net/1721.1/136720.2
Department
Massachusetts Institute of Technology. Department of Mechanical Engineering
Journal
SiliconPV 2018, The 8th International Conference on Crystalline Silicon Photovoltaics
Publisher
Author(s)
Citation
Laine, Hannu S., Vahlman, Henri, Haarahiltunen, Antti, Jensen, Mallory A., Modanese, Chiara et al. 2018. "Vertically integrated modeling of light-induced defects: Process modeling, degradation kinetics and device impact." 1999.
Version: Final published version
ISBN
978-0-7354-1715-1
Collections

Version History

VersionItemDateSummary
21721.1/136720.2*2021-12-13T16:45:12ZVerified or entered authority and publication metadata
11721.1/1367202021-10-28T17:46:33Z

*Selected version