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Vertically integrated modeling of light-induced defects: Process modeling, degradation kinetics and device impact
| dc.contributor.author | Laine, Hannu S. | |
| dc.contributor.author | Vahlman, Henri | |
| dc.contributor.author | Haarahiltunen, Antti | |
| dc.contributor.author | Jensen, Mallory A. | |
| dc.contributor.author | Modanese, Chiara | |
| dc.contributor.author | Wagner, Matthias | |
| dc.contributor.author | Wolny, Franziska | |
| dc.contributor.author | Buonassisi, Tonio | |
| dc.contributor.author | Savin, Hele | |
| dc.date.accessioned | 2021-10-28T17:46:33Z | |
| dc.date.available | 2021-10-28T17:46:33Z | |
| dc.date.issued | 2018 | |
| dc.identifier.uri | https://hdl.handle.net/1721.1/136720 | |
| dc.language.iso | en | |
| dc.publisher | Author(s) | en_US |
| dc.relation.isversionof | 10.1063/1.5049255 | en_US |
| dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en_US |
| dc.source | Other repository | en_US |
| dc.title | Vertically integrated modeling of light-induced defects: Process modeling, degradation kinetics and device impact | en_US |
| dc.type | Article | en_US |
| dc.identifier.citation | Laine, Hannu S., Vahlman, Henri, Haarahiltunen, Antti, Jensen, Mallory A., Modanese, Chiara et al. 2018. "Vertically integrated modeling of light-induced defects: Process modeling, degradation kinetics and device impact." 1999. | |
| dc.eprint.version | Final published version | en_US |
| dc.type.uri | http://purl.org/eprint/type/ConferencePaper | en_US |
| eprint.status | http://purl.org/eprint/status/NonPeerReviewed | en_US |
| dc.date.updated | 2020-06-24T18:30:47Z | |
| dspace.date.submission | 2020-06-24T18:30:50Z | |
| mit.journal.volume | 1999 | en_US |
| mit.license | PUBLISHER_POLICY | |
| mit.metadata.status | Authority Work and Publication Information Needed | en_US |
