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This is not the latest version of this item. The latest version can be found at:https://dspace.mit.edu/handle/1721.1/137678.2
Deep Metric Learning via Facility Location
| dc.contributor.author | Song, Hyun Oh | |
| dc.contributor.author | Jegelka, Stefanie | |
| dc.contributor.author | Rathod, Vivek | |
| dc.contributor.author | Murphy, Kevin | |
| dc.date.accessioned | 2021-11-08T15:12:27Z | |
| dc.date.available | 2021-11-08T15:12:27Z | |
| dc.date.issued | 2017-07 | |
| dc.identifier.uri | https://hdl.handle.net/1721.1/137678 | |
| dc.description.abstract | © 2017 IEEE. Learning image similarity metrics in an end-to-end fashion with deep networks has demonstrated excellent results on tasks such as clustering and retrieval. However, current methods, all focus on a very local view of the data. In this paper, we propose a new metric learning scheme, based on structured prediction, that is aware of the global structure of the embedding space, and which is designed to optimize a clustering quality metric (NMI). We show state of the art performance on standard datasets, such as CUB200-2011 [37], Cars196 [18], and Stanford online products [30] on NMI and R@K evaluation metrics. | en_US |
| dc.language.iso | en | |
| dc.publisher | IEEE | en_US |
| dc.relation.isversionof | 10.1109/cvpr.2017.237 | en_US |
| dc.rights | Creative Commons Attribution-Noncommercial-Share Alike | en_US |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-sa/4.0/ | en_US |
| dc.source | arXiv | en_US |
| dc.title | Deep Metric Learning via Facility Location | en_US |
| dc.type | Article | en_US |
| dc.identifier.citation | Song, Hyun Oh, Jegelka, Stefanie, Rathod, Vivek and Murphy, Kevin. 2017. "Deep Metric Learning via Facility Location." | |
| dc.eprint.version | Author's final manuscript | en_US |
| dc.type.uri | http://purl.org/eprint/type/ConferencePaper | en_US |
| eprint.status | http://purl.org/eprint/status/NonPeerReviewed | en_US |
| dc.date.updated | 2019-06-03T16:26:05Z | |
| dspace.date.submission | 2019-06-03T16:26:14Z | |
| mit.license | OPEN_ACCESS_POLICY | |
| mit.metadata.status | Authority Work and Publication Information Needed | en_US |
