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Deep Metric Learning via Facility Location
Author(s)
Song, Hyun Oh; Jegelka, Stefanie; Rathod, Vivek; Murphy, Kevin
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© 2017 IEEE. Learning image similarity metrics in an end-to-end fashion with deep networks has demonstrated excellent results on tasks such as clustering and retrieval. However, current methods, all focus on a very local view of the data. In this paper, we propose a new metric learning scheme, based on structured prediction, that is aware of the global structure of the embedding space, and which is designed to optimize a clustering quality metric (NMI). We show state of the art performance on standard datasets, such as CUB200-2011 [37], Cars196 [18], and Stanford online products [30] on NMI and R@K evaluation metrics.
Date issued
2017-07Publisher
IEEE
Citation
Song, Hyun Oh, Jegelka, Stefanie, Rathod, Vivek and Murphy, Kevin. 2017. "Deep Metric Learning via Facility Location."
Version: Author's final manuscript