Synergistic effects of anisotropy and image force on TEM diffraction contrast of dislocation loops

Author(s)
WU, W.; SCHÄUBLIN, R.
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Date issued
2020-04
URI
https://hdl.handle.net/1721.1/140816.2
Department
Massachusetts Institute of Technology. Department of Mechanical Engineering
Journal
Journal of Microscopy
Publisher
Wiley
Citation
WU, W. and SCHÄUBLIN, R. 2020. "Synergistic effects of anisotropy and image force on TEM diffraction contrast of dislocation loops." Journal of Microscopy, 278 (1).
Version: Author's final manuscript
ISSN
0022-2720
1365-2818
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21721.1/140816.2*2022-02-28T19:46:21ZPublication information verified/added.
11721.1/1408162022-02-28T16:31:27Z

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