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dc.contributor.authorShih, Pao-Chuan
dc.contributor.authorPerozek, Joshua
dc.contributor.authorAkinwande, Akintunde I.
dc.contributor.authorPalacios, Tomás
dc.date.accessioned2024-03-11T20:10:25Z
dc.date.available2024-03-11T20:10:25Z
dc.date.issued2023-11
dc.identifier.issn0741-3106
dc.identifier.issn1558-0563
dc.identifier.urihttps://hdl.handle.net/1721.1/153655
dc.description.abstractField-emission-based vacuum transistors have been proposed as promising candidates for future high-power and harsh-environment electronic devices. However, the lack of an integrated anode is still an issue for vertical field-emission vacuum transistors for some applications such as radiation-hard vacuum electronic-based circuits. In this work, an anode-integration technology enabled by tilted metal deposition is proposed and experimentally demonstrated on GaN gated field emitter arrays (FEAs). Full transistor prototypes with a 103 on-off ratio in anode current are demonstrated. This process is compatible with gated FEAs of various materials, the vacuum channel can be sealed during fabrication, and the vacuum channel length can be controlled via multiple process parameters.en_US
dc.description.sponsorshipDepartment of Defense (DoD)en_US
dc.description.sponsorshipDepartment of Energy (DOE)en_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.isversionof10.1109/led.2023.3317071en_US
dc.rightsCreative Commons Attribution-Noncommercial-ShareAlikeen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourceAuthoren_US
dc.subjectElectrical and Electronic Engineeringen_US
dc.subjectElectronic, Optical and Magnetic Materialsen_US
dc.titleAnode-Integrated GaN Field Emitter Arrays for Compact Vacuum Transistorsen_US
dc.typeArticleen_US
dc.identifier.citationP. -C. Shih, J. Perozek, A. I. Akinwande and T. Palacios, "Anode-Integrated GaN Field Emitter Arrays for Compact Vacuum Transistors," in IEEE Electron Device Letters, vol. 44, no. 11, pp. 1895-1898, Nov. 2023.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Microsystems Technology Laboratories
dc.relation.journalIEEE Electron Device Lettersen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.identifier.doi10.1109/LED.2023.3317071
dspace.date.submission2024-03-09T02:21:51Z
mit.journal.volume44en_US
mit.journal.issue11en_US
mit.licenseOPEN_ACCESS_POLICY
mit.metadata.statusAuthority Work and Publication Information Neededen_US


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